Current location:Home > Solar Module EL Tester

Online EL defect detector

Online EL defect detector

Contact US >
  • Details
  • Equipment functions

    Suitable for the detection of obvious/hidden crack, fragment, black chip, broken grid, sintered mesh, contamination and other defects of crystal silicon cell.

     

    Equipment characteristics

    Infrared imaging camera, direct shooting

    Are suitable for multi-specification components

    The fault is automatically powered on

    Water signal docking

    Are connected to the MES system

     

    Equipment technical parameters

    Model

    ST-EL10

    Component size

    1600*1000mm to 2600*1600mm

    Scanning method

    Direct scanning

    Position

    Before Lamination / After Lamination

    Component in and out method

    The form of incoming and outgoing materials can be changed according to demand

    Transfer table height

    950±30mm

    Speed

    24s/pcs (Testing and judgement)

    Camera type

    Dedicated HD Industrial Camera

    Effective test area

    2500×1400 mm

    Resolution

    2560×1440

    Accuracy

    0.57mm/pixel

    monitor

    4K 50InchUltra clear display

    Constant current power supply

    Programmable Power

    Current range

    0~13.4A, Adjustable

    Voltage range

    0~60V, Adjustable

    Dimensions

    2920×2600×1250 mm

    weight

    0.8T

     


Hits:123  UpdateTime:2022-06-02
Previous:No Information   Next: Semi-automatic EL Defect Testing Machine