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Online EL Tester

Online EL Tester

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  • Details
  • 1. Equipment functions

    Suitable for the detection of defects in crystalline silicon wafers such as visible/ hidden cracks, chips, black wafers, broken grids, sintered webs and contamination.


    2. Equipment characteristics

    Infra-red imaging camera, direct shooting

    Multi-spec module adaptation

    Automatically powered-up

    Flowing signal docking

    MES system interfacing

     

    3. Equipment technical parameters

    Equipment model

    ST-EL10

    Module size

    Length:1000-2600mm, Width:1000-1600mm

    Shooting method

    Direct-shot scanning

    Application type

    Before Lamination / After Lamination

    Acces mode of the module

    The feeding form can be changed according to  the demand

    Transfer table height

    950±30mm

    Test the beat

    24s/tablet (released before judging)

    Camera type

    Dedicated HD Industrial Camera

    Effective test area

    2500×1400 mm

    Resolution ratio

    2560×1440

    Test accuracy

    0.5mm/pixel

    Indicator

    4K 50-inch ultra-clear display

    Constant current power supply

    Programmable power supply

    Current range

    0~15A, Adjustable

    Voltage range

    0~80V, Adjustable

    Dimensions

    2920×2600×1250 mm

    weight

    0.8T

     


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